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Advanced Packaging & Testing Technology Forum
— From CoWoS to CoPoS: Exploration of Advanced Packaging Technology Evolution and Supply Chain Layout for AI Era
Time:2026-09-10
Venue:14C, 2nd Floor, Hall 14
Language:CN

Organizer:

IJIWEI, International Integrated Circuit Innovation Expo (IICIE)

As Moore's Law slows, the exponential growth of AI computing needs is spurring the semiconductor industry toward "More than Moore" system-level innovation. This forum focuses on key packaging technology breakthroughs and innovation paths for High-Performance Computing (HPC).


It will delve into 3.5D heterogeneous integration, integrating Hybrid Bonding and 2.5D interposers, while addressing thermal dissipation bottlenecks of high-performance chips. Additionally, it explores the synergistic value of Silicon Photonics Co-Packaged Optics (CPO), Glass Core substrates and optical interconnection in reducing data center latency and optimizing energy efficiency.


Centering on the upgrade from Wafer-level to Panel-level (FOPLP) packaging, the forum gathers industry chain players (equipment, materials, packaging & testing) to analyze CoWoS-to-CoPoS evolution, core equipment pain points and supply chain strategies, outlining a feasible roadmap for large-scale mass production of AI infrastructure packaging technologies.

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Conference Agenda

Advanced Packaging & Testing Technology Forum
— From CoWoS to CoPoS: Exploration of Advanced Packaging Technology Evolution and Supply Chain Layout for AI Era
TimeTopicsSpeakers
10:00-10:05Opening
10:05-10:25TBCHT-tech
10:25-10:45TBCShaoping Li, Chief Expert, CR MICRO.
10:45-11:05From CoWoS to CoPoS: A New Paradigm for Quality Control in High-Volume Advanced Packaging ManufacturingShuai Yu, Director of Semiconductor Optics Business Division, Wuhan Jingce Electronic Group Co., Ltd.
11:05-11:25The application of heterogeneous bonding technology and wafer bonding equipment for advanced packagingShijie Ma, Technical expert, The 2nd Research Institute of China Technology Group Vorporat.
11:25-11:45TBCJiangsu Silicon Integrity Semiconductor Technology Co., Ltd.
11:45-12:05HBM and Chip Scale Packaging Technologies in Data CentersV.P.Sampath, Founder, Bharath Semiconductor Society, Senior Member of IEEE.
Lunch Break
13:30-13:50Application of Sapphire Carriers in Advanced PackagingSen Kang, Deputy General Manager, TDG Holding Co.,LTD.
13:50-14:10Large-size GCP Glass-based Packaging Substrate TechnologyMingxin Wang, Vice President & Chief Strategy Officer, WG Tech.
14:10-14:30Advanced Packaging and Bonding Technology in the Era of AI Computing PowerChao Guo, Co‑founder & Deputy General Manager, iSABers Group Co., Ltd.
14:30-14:50Establishing China's Next-Gen One-Stop OSAT Platform: Advanced Packaging + Independent Third-Party TestingPeng Xu, Director of Management & Operations Center, Zhejiang Centraway Micro Electronic Technology Co. Ltd.
14:50-15:10TBCCAPCON
15:10-15:30Microscale Electrical Characteristics, Carrier Behavior and Defect Characterization of SiCIvy, Principal Engineer of Material Analysis, Shenzhen Pinghu Laboratory.
15:30-15:50Process Reliability Challenges and Improvement Strategies for Ultra-large-scale Chiplet Advanced PackagingHongbin Shi, Chief Expert of Electronic Packaging, Shanghai Awinic Technology Co., Ltd.
15:50-16:10TBCAnji Haiwanxin Technology Co., Ltd.
16:10-16:303D Imaging Systems for Advanced Packaging and High-Density InterconnectionJasper Ding, General Manager, Phasora3D Optical Imaging Co., Ltd.

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