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Advanced Packaging & Testing Technology Forum
— From CoWoS to CoPoS: Exploration of Advanced Packaging Technology Evolution and Supply Chain Layout for AI Era
Time:2026-09-10
Venue:14C, 2nd Floor, Hall 14
Language:CN

Organizer:

IJIWEI, International Integrated Circuit Innovation Expo

As Moore's Law slows, the exponential growth of AI computing needs is spurring the semiconductor industry toward "More than Moore" system-level innovation. This forum focuses on key packaging technology breakthroughs and innovation paths for High-Performance Computing (HPC).


It will delve into 3.5D heterogeneous integration, integrating Hybrid Bonding and 2.5D interposers, while addressing thermal dissipation bottlenecks of high-performance chips. Additionally, it explores the synergistic value of Silicon Photonics Co-Packaged Optics (CPO), Glass Core substrates and optical interconnection in reducing data center latency and optimizing energy efficiency.


Centering on the upgrade from Wafer-level to Panel-level (FOPLP) packaging, the forum gathers industry chain players (equipment, materials, packaging & testing) to analyze CoWoS-to-CoPoS evolution, core equipment pain points and supply chain strategies, outlining a feasible roadmap for large-scale mass production of AI infrastructure packaging technologies.

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Conference Agenda

Advanced Packaging & Testing Technology Forum
— From CoWoS to CoPoS: Exploration of Advanced Packaging Technology Evolution and Supply Chain Layout for AI Era
TimeTopicsSpeakers
10:00-10:05Opening
10:05-10:15Development of Advanced Packaging Industry in Mainland ChinaTongfu Microelectronics / JCET
10:15-10:35Challenges and Supply Chain Resilience in OSAT Collaborative Expansion of CoWoS + B18 CapacityTongfu Microelectronics / JCET / SJ Semiconductor
10:35-10:55Integration Technology and Thermal Management Challenges of HBM4 and SoCTongfu Microelectronics / JCET / SJ Semiconductor / Yongsi Electronics
10:55-11:15Large-Size Packaging Substrate Process - Solutions for High-Layer Count, Fine Line, and Warpage Control in AI ServersShennan Circuits / Fastprint
11:15-11:35Electrical Characteristics and Mass Production Verification of Glass Core Substrates in High-Performance ComputingBOE / Vogel / Tungsu Group
11:35-11:55Next-Generation Metrology and Defect Inspection Technology for TGV and Fine-Line RDLJingce Electronic / HSD / Skyverse
Lunch
14:00-14:20Innovation in Glass Materials for Advanced PackagingBOE / Vogel / Tungsu Group
14:20-14:40Bridging the Miniaturization Gap - Interconnect Technology from Advanced Thermo-Compression Bonding(TCB/LAB) to Submicron Hybrid BondingQinghe Yuan / Piotech
14:40-15:00Bonding Revolution in the Post-Moore Era - Fluxless TCB, Room-Temperature Bonding (SAB), and Heterogeneous Integration Mass Production BreakthroughsNXP/STMicroelectronics/ASM International/K&S/TEL
Qinghe Yuan / Piotech
15:00-15:20TCB Capacity Bottlenecks and Hybrid Bonding Yield Challenges - Equipment SolutionsQinghe Yuan / Piotech / Advanced Packaging Company
15:20-15:40BESi/Suss MicroTec/EVG(Mass Production Breakthroughs in Wafer-to-Wafer (W2W) and Die-to-Wafer (D2W) Hybrid Bonding EquipmentsBESi/Suss MicroTec/EVG
Qinghe Yuan / Piotech / Xinhuilian
15:40-16:00Capacity and Cost-Effectiveness Analysis from Wafer-Level to Panel-Level Packaging (PLP)NEPES
/Huatian Technology / Tongfu Microelectronics
16:00-16:20Equipment Challenges in Large-Area Packaging Processes - Panel-Level Coating Uniformity, Warpage Control, and Dicing PrecisionACCRETECH)/TEL/SCREEN/DISCO/TOWA
ACM Research / Depu
16:20-16:40Design Challenges in 3.5D Heterogeneous Integration - EDA Solutions from System-Level Planning to Multi-Chip Thermal ManagementSynopsys
Xpeedic / UniVista

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