Organizer:
IJIWEI, International Integrated Circuit Innovation Expo
As Moore's Law slows, the exponential growth of AI computing needs is spurring the semiconductor industry toward "More than Moore" system-level innovation. This forum focuses on key packaging technology breakthroughs and innovation paths for High-Performance Computing (HPC).
It will delve into 3.5D heterogeneous integration, integrating Hybrid Bonding and 2.5D interposers, while addressing thermal dissipation bottlenecks of high-performance chips. Additionally, it explores the synergistic value of Silicon Photonics Co-Packaged Optics (CPO), Glass Core substrates and optical interconnection in reducing data center latency and optimizing energy efficiency.
Centering on the upgrade from Wafer-level to Panel-level (FOPLP) packaging, the forum gathers industry chain players (equipment, materials, packaging & testing) to analyze CoWoS-to-CoPoS evolution, core equipment pain points and supply chain strategies, outlining a feasible roadmap for large-scale mass production of AI infrastructure packaging technologies.
| Time | Topics | Speakers |
|---|---|---|
| 10:00-10:05 | Opening | |
| 10:05-10:15 | Development of Advanced Packaging Industry in Mainland China | Tongfu Microelectronics / JCET |
| 10:15-10:35 | Challenges and Supply Chain Resilience in OSAT Collaborative Expansion of CoWoS + B18 Capacity | Tongfu Microelectronics / JCET / SJ Semiconductor |
| 10:35-10:55 | Integration Technology and Thermal Management Challenges of HBM4 and SoC | Tongfu Microelectronics / JCET / SJ Semiconductor / Yongsi Electronics |
| 10:55-11:15 | Large-Size Packaging Substrate Process - Solutions for High-Layer Count, Fine Line, and Warpage Control in AI Servers | Shennan Circuits / Fastprint |
| 11:15-11:35 | Electrical Characteristics and Mass Production Verification of Glass Core Substrates in High-Performance Computing | BOE / Vogel / Tungsu Group |
| 11:35-11:55 | Next-Generation Metrology and Defect Inspection Technology for TGV and Fine-Line RDL | Jingce Electronic / HSD / Skyverse |
| Lunch | ||
| 14:00-14:20 | Innovation in Glass Materials for Advanced Packaging | BOE / Vogel / Tungsu Group |
| 14:20-14:40 | Bridging the Miniaturization Gap - Interconnect Technology from Advanced Thermo-Compression Bonding(TCB/LAB) to Submicron Hybrid Bonding | Qinghe Yuan / Piotech |
| 14:40-15:00 | Bonding Revolution in the Post-Moore Era - Fluxless TCB, Room-Temperature Bonding (SAB), and Heterogeneous Integration Mass Production Breakthroughs | NXP/STMicroelectronics/ASM International/K&S/TEL Qinghe Yuan / Piotech |
| 15:00-15:20 | TCB Capacity Bottlenecks and Hybrid Bonding Yield Challenges - Equipment Solutions | Qinghe Yuan / Piotech / Advanced Packaging Company |
| 15:20-15:40 | BESi/Suss MicroTec/EVG(Mass Production Breakthroughs in Wafer-to-Wafer (W2W) and Die-to-Wafer (D2W) Hybrid Bonding Equipments | BESi/Suss MicroTec/EVG Qinghe Yuan / Piotech / Xinhuilian |
| 15:40-16:00 | Capacity and Cost-Effectiveness Analysis from Wafer-Level to Panel-Level Packaging (PLP) | NEPES /Huatian Technology / Tongfu Microelectronics |
| 16:00-16:20 | Equipment Challenges in Large-Area Packaging Processes - Panel-Level Coating Uniformity, Warpage Control, and Dicing Precision | ACCRETECH)/TEL/SCREEN/DISCO/TOWA ACM Research / Depu |
| 16:20-16:40 | Design Challenges in 3.5D Heterogeneous Integration - EDA Solutions from System-Level Planning to Multi-Chip Thermal Management | Synopsys Xpeedic / UniVista |